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Influence of Rare-Earth Dopants on Barium Titanate Ceramics Microstructure and Corresponding Electrical Properties
dc.creator | Mitić, Vojislav V. | |
dc.creator | Nikolić, Zoran S. | |
dc.creator | Pavlović, Vladimir | |
dc.creator | Paunović, Vesna | |
dc.creator | Miljković, Miroslav | |
dc.creator | Jordović, Branka | |
dc.creator | Zivković, Ljiljana | |
dc.date.accessioned | 2020-12-17T19:54:04Z | |
dc.date.available | 2020-12-17T19:54:04Z | |
dc.date.issued | 2010 | |
dc.identifier.issn | 0002-7820 | |
dc.identifier.uri | http://aspace.agrif.bg.ac.rs/handle/123456789/2372 | |
dc.description.abstract | In this article, ytterbium and erbium oxides are used as doping materials for barium titanate (BaTiO(3)) materials. The amphoteric behavior of these rare-earth ions leads to the increase of dielectric permittivity and decrease of dielectric losses. BaTiO(3) ceramics doped with 0.01-0.5 wt% of Yb(2)O(3) and Er(2)O(3) were prepared by conventional solid-state procedure and sintered at 1320 degrees C for 4 h. In BaTiO(3) doped with a low content of rare-earth ions (0.01 wt%) the grain size ranged between 10 and 25 pm. With the higher dopant concentration of 0.5 wt%, the abnormal grain growth is inhibited and the grain size ranged between 2 and 10 mu m. The measurements of capacitance and dielectric losses as a function of frequency and temperature have been carried out in order to correlate the microstructure and dielectric properties of doped BaTiO(3) ceramics. The temperature dependence of the dielectric constant as a function of dopant amount has been investigated. | en |
dc.publisher | Wiley-Blackwell Publishing, Inc, Malden | |
dc.relation | info:eu-repo/grantAgreement/MESTD/MPN2006-2010/142011/RS// | |
dc.rights | restrictedAccess | |
dc.source | Journal of the American Ceramic Society | |
dc.title | Influence of Rare-Earth Dopants on Barium Titanate Ceramics Microstructure and Corresponding Electrical Properties | en |
dc.type | article | |
dc.rights.license | ARR | |
dc.citation.epage | 137 | |
dc.citation.issue | 1 | |
dc.citation.other | 93(1): 132-137 | |
dc.citation.rank | aM21 | |
dc.citation.spage | 132 | |
dc.citation.volume | 93 | |
dc.identifier.doi | 10.1111/j.1551-2916.2009.03309.x | |
dc.identifier.scopus | 2-s2.0-73149102073 | |
dc.identifier.wos | 000273392900025 | |
dc.type.version | publishedVersion |