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Microstructure and Dielectric Properties of Rare-Earth Doped BaTiO3 Ceramics
dc.creator | Mitić, V.V. | |
dc.creator | Paunović, V. | |
dc.creator | Pavlović, Vladimir | |
dc.date.accessioned | 2020-12-17T20:58:58Z | |
dc.date.available | 2020-12-17T20:58:58Z | |
dc.date.issued | 2014 | |
dc.identifier.issn | 0015-0193 | |
dc.identifier.uri | http://aspace.agrif.bg.ac.rs/handle/123456789/3449 | |
dc.description.abstract | The specimens of BaTiO3 doped with 0.01, 0.1 and 0.5wt% of Er2O3 or Ho2O3 used for this investigation were prepared by the conventional solid state reaction. The specimens were sintered at 1350 degrees C in an air atmosphere for 4hours.The grain size and microstructure characteristics for various samples and their phase composition was carried out using a scanning electron microscope SEM equipped with EDS system. SEM analysis of Er/BaTiO3 and Ho/BaTiO3 doped ceramics showed that in samples doped with a low level of rare-earth ions, the grain size ranged from 10-60m, while with the higher dopant concentration the abnormal grain growth is inhibited and the grain size ranged between 2-10m.We also applied the fractal method in microstructure analysis of sintered ceramics especially as influence on dielectric properties of BaTiO3 ceramics. These fractal effects have been used for better understanding of intergranular capacitors. | en |
dc.publisher | Taylor & Francis Ltd, Abingdon | |
dc.relation | info:eu-repo/grantAgreement/MESTD/Basic Research (BR or ON)/172057/RS// | |
dc.rights | restrictedAccess | |
dc.source | Ferroelectrics | |
dc.subject | BaTiO3-ceramics | en |
dc.subject | dopant | en |
dc.subject | rare-earth | en |
dc.subject | microstructure | en |
dc.subject | fractals | en |
dc.title | Microstructure and Dielectric Properties of Rare-Earth Doped BaTiO3 Ceramics | en |
dc.type | article | |
dc.rights.license | ARR | |
dc.citation.epage | 167 | |
dc.citation.issue | 1 | |
dc.citation.other | 470(1): 159-167 | |
dc.citation.rank | M23 | |
dc.citation.spage | 159 | |
dc.citation.volume | 470 | |
dc.identifier.doi | 10.1080/00150193.2014.923229 | |
dc.identifier.scopus | 2-s2.0-84908151734 | |
dc.identifier.wos | 000343316400020 | |
dc.type.version | publishedVersion |